Direct method of measuring intensity of diffraction pattern by photoelectric cell
| dc.contributor.author | Brandhorst, Armin Ervin. | en_US |
| dc.date.accessioned | 2015-12-31T20:30:20Z | |
| dc.date.available | 2015-12-31T20:30:20Z | |
| dc.date.issued | 1931 | en_US |
| dc.date.published | 1931 | en_US |
| dc.description | Call number: LD2668 .T4 1931 B71 | en_US |
| dc.description.level | Masters | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/23960 | |
| dc.subject.AAT | Masters theses | en_US |
| dc.subject.LCSH | X-rays--Diffraction. | en_US |
| dc.title | Direct method of measuring intensity of diffraction pattern by photoelectric cell | en_US |
| dc.type | Text | en_US |
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