Computer controlled deep level transient spectroscopy system
dc.contributor.author | Mehta, Hemant | en_US |
dc.date.accessioned | 2011-06-28T21:48:26Z | |
dc.date.available | 2011-06-28T21:48:26Z | |
dc.date.digitized | 2010 | en_US |
dc.date.issued | 1986 | en_US |
dc.date.published | 1986 | en_US |
dc.description | Typescript (photocopy). | en_US |
dc.description | Digitized by Kansas Correctional Industries | en_US |
dc.description.department | Department: Electrical and Computer Engineering. | en_US |
dc.description.level | Masters | en_US |
dc.identifier.uri | http://hdl.handle.net/2097/9936 | |
dc.language | en_US | en_US |
dc.publisher | Kansas State University | en_US |
dc.rights.accessRights | This volume was digitized and made accessible online due to deterioration of the original print copy. If you are the author of this work and would like to have online access removed, please contact the Library Administration Office, 785-532-7400, library@k-state.edu. | en_US |
dc.standard.bitdepth | 8 bit grayscale | en_US |
dc.standard.capturehardware | Fujitsu fi-5120C | en_US |
dc.standard.capturesoftwaresettings | Scandall 21 Version 4.3.11 | en_US |
dc.standard.resolution | 200 dpi | en_US |
dc.subject.LCSH | Transients (Electricity) | en_US |
dc.subject.LCSH | Semiconductors--Thermal properties | en_US |
dc.subject.LCSH | C♯ (Computer program language) | en_US |
dc.subject.LCSH | Spectrum analysis--Computer programs | en_US |
dc.title | Computer controlled deep level transient spectroscopy system | en_US |
dc.type | Thesis | en_US |
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