Techniques for testing a 15-bit data acquisition system
| dc.contributor.author | Doerfler, Douglas Wayne. | en_US |
| dc.date.accessioned | 2015-12-31T21:53:22Z | |
| dc.date.available | 2015-12-31T21:53:22Z | |
| dc.date.issued | 1985 | en_US |
| dc.date.published | 1985 | en_US |
| dc.description | Call number: LD2668 .T4 1985 D63 | en_US |
| dc.description.degree | Master of Science | en_US |
| dc.description.level | Masters | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/27427 | |
| dc.subject.AAT | Masters theses | en_US |
| dc.subject.LCSH | Analog-to-digital converters--Testing. | en_US |
| dc.subject.LCSH | Digital-to-analog converters--Testing. | en_US |
| dc.title | Techniques for testing a 15-bit data acquisition system | en_US |
| dc.type | Text | en_US |
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