Simulation of gallium nitride vertical fin-shaped field effect transistor for use as thermal neutron detector
dc.contributor.author | Davidson, Bryce L. | |
dc.date.accessioned | 2023-11-30T21:04:46Z | |
dc.date.available | 2023-11-30T21:04:46Z | |
dc.date.graduationmonth | May | |
dc.date.issued | 2024-05-01 | |
dc.description.abstract | Through the use of a radiation detection system simulation framework, a gallium nitride vertical fin-shaped field effect transistor (FinFET) was investigated for output response when utilized as a thermal neutron detector. The FinFET was assumed to have been backfilled between fins with boron carbide, reactive to thermal neutrons. The GaN FinFET response was modeled with radiation transport from MCNP, and semiconductor physics and charge carrier transport using COMSOL Multiphysics. Fabricated FinFET devices (not neutron reactive) were tested for electrical performance characteristics to aid in the tuning of the COMSOL FinFET model. Through time-dependent simulation studies, the drain current response pulse to a single event was collected. This was done for several input parameters including particle type, energy, location of entry, and angle of entry to produce a data look-up table. By integrating the current pulses over time, the induced charge was calculated. Using the results of the radiation transport PTRAC file in combination with the induced charge database, an integrated charge spectrum was calculated. Results of this work showed the capabilities of the GaN FinFET for use as a thermal neutron detector, through the radiation transport studies, fabricated FinFET device testing, and electronic charge carrier transport studies. The radiation transport studies found a thermal neutron detection efficiency of 0.8%. Through the fabricated FinFET device testing, it was found that multifin devices show variation in output characteristics, concluding that tuning and calibrating of detection devices would be necessary. Through the electronic charge carrier transport studies, it was found that simulated ionization could be detected through the drain current, where holes contributed to the most induced charge over time. Overall, the simulated GaN FinFET may detect thermal neutrons inefficiently compared to other sensing technology, but perhaps may be useful with its claimed radiation hardness. | |
dc.description.advisor | Amir Bahadori | |
dc.description.degree | Master of Science | |
dc.description.department | Department of Mechanical and Nuclear Engineering | |
dc.description.level | Masters | |
dc.description.sponsorship | Department of Energy’s Kansas City National Security Campus, operated by Honeywell Federal Manufacturing & Technologies, LLC under contract number DE-NA0002839. Beocat Research Cluster at Kansas State University, which is funded in part by National Science Foundation grants CNS-1006860, EPS-1006860, EPS-0919443, ACI-1440548, CHE-1726332, and NIH P20GM113109. | |
dc.identifier.uri | https://hdl.handle.net/2097/43632 | |
dc.language.iso | en_US | |
dc.publisher | Kansas State University | |
dc.rights | © the author. This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s). | |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
dc.subject | Radiation transport | |
dc.subject | Charge transport | |
dc.subject | Gallium nitride | |
dc.subject | Thermal neutron detector | |
dc.subject | Semiconductor simulation | |
dc.title | Simulation of gallium nitride vertical fin-shaped field effect transistor for use as thermal neutron detector | |
dc.type | Thesis |