From carrier dynamics inside fused silica to control of multiphoton-avalanche ionization for laser machining

Files

LeiQELS2010.pdf (295.31 KB)

Date

Authors

Publisher

Institute of Electrical and Electronics Engineers

Abstract

Using pump-probe measurements, we characterize carrier decay time inside fused silica and measure deeply bound self-trapped excitons. With pump-probe delay, we also control free carrier injection and the subsequent avalanche process for laser machining applications.

Keywords

Multiphoton processes, Ultrafast processes, Condensed matter, Semiconductors

URI

http://hdl.handle.net/2097/4311

Collections

Industrial and Manufacturing Systems Engineering Faculty Research and Publications

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Except where otherwise noted, this item's license is described as This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).