Image classification with dense SIFT sampling: an exploration of optimal parameters

dc.contributor.authorChavez, Aaron J.
dc.date.accessioned2012-04-27T20:09:47Z
dc.date.available2012-04-27T20:09:47Z
dc.date.graduationmonthMayen_US
dc.date.issued2012-04-27
dc.date.published2012en_US
dc.description.abstractIn this paper we evaluate a general form of image classification algorithm based on dense SIFT sampling. This algorithm is present in some form in most state-of-the-art classification systems. However, in this algorithm, numerous parameters must be tuned, and current research provides little insight into effective parameter tuning. We explore the relationship between various parameters and classification performance. Many of our results suggest that there are basic modifications which would improve state-of-the-art algorithms. Additionally, we develop two novel concepts, sampling redundancy and semantic capacity, to explain our data. These concepts provide additional insight into the limitations and potential improvements of state-of-the-art algorithms.en_US
dc.description.advisorDavid A. Gustafsonen_US
dc.description.degreeDoctor of Philosophyen_US
dc.description.departmentDepartment of Computer Scienceen_US
dc.description.levelDoctoralen_US
dc.identifier.urihttp://hdl.handle.net/2097/13735
dc.language.isoen_USen_US
dc.publisherKansas State Universityen
dc.subjectImage classificationen_US
dc.subjectSIFTen_US
dc.subjectPASCAL Visual Object Classes Challengeen_US
dc.subject.umiComputer Science (0984)en_US
dc.titleImage classification with dense SIFT sampling: an exploration of optimal parametersen_US
dc.typeDissertationen_US

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