Addition of built-in self-testing capability to the Intel SBC 80/10A single board computer
| dc.contributor.author | Yeo, Cheow Fatt | en_US |
| dc.date.accessioned | 2012-08-08T20:58:42Z | |
| dc.date.available | 2012-08-08T20:58:42Z | |
| dc.date.digitized | 2011 | en_US |
| dc.date.issued | 1986 | en_US |
| dc.date.published | 1986 | en_US |
| dc.description | Typescript (photocopy). | en_US |
| dc.description | Digitized by Kansas State University Libraries | en_US |
| dc.description.department | Department: Electrical and Computer Engineering. | en_US |
| dc.description.level | Masters | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/14155 | |
| dc.language | en_US | en_US |
| dc.publisher | Kansas State University | en_US |
| dc.rights.accessRights | This volume was digitized and made accessible online due to deterioration of the original print copy. If you are the author of this work and would like to have online access removed, please contact the Library Administration Office, 785-532-7400, library@k-state.edu. | en_US |
| dc.standard.bitdepth | 8 bit grayscale | en_US |
| dc.standard.capturehardware | Epson Expression 10000XL | en_US |
| dc.standard.capturesoftwaresettings | Epson Scan | en_US |
| dc.standard.resolution | 300 dpi | en_US |
| dc.subject.LCSH | Microprocessors | en_US |
| dc.subject.LCSH | Computer engineering | en_US |
| dc.subject.LCSH | Software architecture | en_US |
| dc.title | Addition of built-in self-testing capability to the Intel SBC 80/10A single board computer | en_US |
| dc.type | Thesis | en_US |
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