A Markovian reliability analysis of electronic circuits

dc.contributor.authorSundararaman, M.en_US
dc.date.accessioned2015-12-30T22:52:25Z
dc.date.available2015-12-30T22:52:25Z
dc.date.issued1965en_US
dc.date.published1965en_US
dc.descriptionCall number: LD2668 .R4 1965 S957en_US
dc.description.levelMastersen_US
dc.identifier.urihttp://hdl.handle.net/2097/22043
dc.subject.AATMasters thesesen_US
dc.titleA Markovian reliability analysis of electronic circuitsen_US
dc.typeTexten_US

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