Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination
| dc.contributor.author | Tomlinson, Sean R. | |
| dc.contributor.author | McGown, Ty | |
| dc.contributor.author | Schlup, John | |
| dc.contributor.author | Anthony, Jennifer L. | |
| dc.contributor.authoreid | srt5555 | en_US |
| dc.contributor.authoreid | jrsch | en_US |
| dc.contributor.authoreid | anthonyj | en_US |
| dc.date.accessioned | 2011-07-29T13:54:18Z | |
| dc.date.available | 2011-07-29T13:54:18Z | |
| dc.date.issued | 2011-07-29 | |
| dc.date.published | 2011 | en_US |
| dc.description.abstract | X-ray diffraction is commonly used to examine zeolite structure, but it is unable to see small changes in the long-or short-range structure. Infrared spectroscopy is used to examine changes in the long-and short-range structure of zeolite. Structural changes in zeolite CIT-6 and derivatives upon chemical treatment are identified with mid-and far-infrared spectroscopy. Differences in the local structure of the sample are observed in the mid-and far-infrared spectra. | en_US |
| dc.description.conference | 16th Annual K-State Research Forum, Kansas State University, Manhattan, KS, April 20, 2011 | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/10853 | |
| dc.relation.isPartOf | K-State Research Forum | en_US |
| dc.subject | Zeolite | en_US |
| dc.subject | Infrared spectroscopy | en_US |
| dc.subject | X-ray diffraction | en_US |
| dc.subject | Aluminosilicate | en_US |
| dc.subject | Mid-infrared | en_US |
| dc.subject | Far-infrared | en_US |
| dc.title | Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination | en_US |
| dc.type | Poster | en_US |
