Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination

Date

2011-07-29

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Abstract

X-ray diffraction is commonly used to examine zeolite structure, but it is unable to see small changes in the long-or short-range structure. Infrared spectroscopy is used to examine changes in the long-and short-range structure of zeolite. Structural changes in zeolite CIT-6 and derivatives upon chemical treatment are identified with mid-and far-infrared spectroscopy. Differences in the local structure of the sample are observed in the mid-and far-infrared spectra.

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Keywords

Zeolite, Infrared spectroscopy, X-ray diffraction, Aluminosilicate, Mid-infrared, Far-infrared

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