Off-line quality control by robust parameter design

K-REx Repository

Show simple item record Min, Jun Young 2008-04-08T19:06:55Z 2008-04-08T19:06:55Z 2008-04-08T19:06:55Z
dc.description.abstract There have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's robust parameter design, response surface approach and semi-parameter design. Considerable attention has been placed on the semi-parameter design. This approach is new technology that was introduced to Picke, Robinson, Birch and Anderson-Cook (2006). The method is a combined parametric and nonparametric technique to improve the estimates of both the mean and the variance of the response. en
dc.language.iso en_US en
dc.publisher Kansas State University en
dc.subject Robust en
dc.subject Taguchi en
dc.subject response en
dc.subject semi-parameter en
dc.title Off-line quality control by robust parameter design en
dc.type Report en Master of Science en
dc.description.level Masters en
dc.description.department Department of Statistics en
dc.description.advisor Shie-Shien Yang en
dc.subject.umi Statistics (0463) en 2008 en May en

Files in this item

This item appears in the following Collection(s)

Show simple item record

Search K-REx

Advanced Search


My Account


Center for the

Advancement of Digital