Off-line quality control by robust parameter design

dc.contributor.authorMin, Jun Young
dc.date.accessioned2008-04-08T19:06:55Z
dc.date.available2008-04-08T19:06:55Z
dc.date.graduationmonthMay
dc.date.issued2008-04-08T19:06:55Z
dc.date.published2008
dc.description.abstractThere have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's robust parameter design, response surface approach and semi-parameter design. Considerable attention has been placed on the semi-parameter design. This approach is new technology that was introduced to Picke, Robinson, Birch and Anderson-Cook (2006). The method is a combined parametric and nonparametric technique to improve the estimates of both the mean and the variance of the response.
dc.description.advisorShie-Shien Yang
dc.description.degreeMaster of Science
dc.description.departmentDepartment of Statistics
dc.description.levelMasters
dc.identifier.urihttp://hdl.handle.net/2097/597
dc.language.isoen_US
dc.publisherKansas State University
dc.rights© the author. This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectRobust
dc.subjectTaguchi
dc.subjectresponse
dc.subjectsemi-parameter
dc.subject.umiStatistics (0463)
dc.titleOff-line quality control by robust parameter design
dc.typeReport

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