Evaluation of wheat chromosome translocation lines for high temperature stress tolerance at grain filling stage

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dc.contributor.author Pradhan, Gautam Prasad
dc.contributor.author Prasad, P. V. Vara
dc.date.accessioned 2015-03-24T20:11:20Z
dc.date.available 2015-03-24T20:11:20Z
dc.date.issued 2015-03-24
dc.identifier.uri http://hdl.handle.net/2097/18895
dc.description Citation: Evaluation of Wheat Chromosome Translocation Lines for High Temperature Stress Tolerance at Grain Filling Stage Pradhan GP, Prasad PVV (2015) Evaluation of Wheat Chromosome Translocation Lines for High Temperature Stress Tolerance at Grain Filling Stage. PLoS ONE 10(2): e0116620. doi: 10.1371/journal.pone.0116620 en_US
dc.description.abstract High temperature (HT, heat) stress is detrimental to wheat (Triticum aestivum L.) production. Wild relatives of bread wheat may offer sources of HT stress tolerance genes because they grow in stressed habitats. Wheat chromosome translocation lines, produced by introgressing small segments of chromosome from wild relatives to bread wheat, were evaluated for tolerance to HT stress during the grain filling stage. Sixteen translocation lines and four wheat cultivars were grown at optimum temperature (OT) of 22/14°C (day/night). Ten days after anthesis, half of the plants were exposed to HT stress of 34/26°C for 16 d, and other half remained at OT. Results showed that HT stress decreased grain yield by 43% compared with OT. Decrease in individual grain weight (by 44%) was the main reason for yield decline at HT. High temperature stress had adverse effects on leaf chlorophyll content and Fv/Fm; and a significant decrease in Fv/Fm was associated with a decline in individual grain weight. Based on the heat response (heat susceptibility indices, HSIs) of physiological and yield traits to each other and to yield HSI, TA5594, TA5617, and TA5088 were highly tolerant and TA5637 and TA5640 were highly susceptible to HT stress. Our results suggest that change in Fv/Fm is a highly useful trait in screening genotypes for HT stress tolerance. This study showed that there is genetic variability among wheat chromosome translocation lines for HT stress tolerance at the grain filling stage and we suggest further screening of a larger set of translocation lines. en_US
dc.language.iso en_US en_US
dc.relation.uri https://doi.org/10.1371/journal.pone.0116620 en_US
dc.rights Attribution 4.0 International (CC BY 4.0) en_US
dc.rights.uri http://creativecommons.org/licenses/by/4.0/ en_US
dc.subject Wheat en_US
dc.subject High temperature stress tolerance en_US
dc.subject Wheat chromosome translocation lines en_US
dc.title Evaluation of wheat chromosome translocation lines for high temperature stress tolerance at grain filling stage en_US
dc.type Article (publisher version) en_US
dc.date.published 2015 en_US
dc.citation.doi 10.1371/journal.pone.0116620 en_US
dc.citation.issue 2 en_US
dc.citation.jtitle PLoS ONE en_US
dc.citation.spage e0116620 en_US
dc.citation.volume 10 en_US
dc.contributor.authoreid vara en_US


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