Berry, B.Zohrabi, M.Hayes, D.Ablikim, U.Jochim, B.Severt, T.Carnes, Kevin D.Ben-Itzhak, Itzik2016-04-062016-04-062015-04-03http://hdl.handle.net/2097/32363Citation: Berry, B., Zohrabi, M., Hayes, D., Ablikim, U., Jochim, B., Severt, T., . . . Ben-Itzhak, I. (2015). Note: Determining the detection efficiency of excited neutral atoms by a microchannel plate detector. Review of Scientific Instruments, 86(4), 3. doi:10.1063/1.4916953We present a method for determining the detection efficiency of neutral atoms relative to keV ions. Excited D* atoms are produced by D-2 fragmentation in a strong laser field. The fragments are detected by a micro-channel plate detector either directly as neutrals or as keV ions following field ionization and acceleration by a static electric field. Moreover, we propose a new mechanism by which neutrals are detected. We show that the ratio of the yield of neutrals and ions can be related to the relative detection efficiency of these species. (C) 2015 AIP Publishing LLC.This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).http://rightsstatements.org/vocab/InC/1.0/Instruments & InstrumentationPhysicsArticle