Lei, ShutingGrojo, D.Barillot, T.Gertsvolf, M.Chang, ZenghuRayner, D. M.Corkum, P. B.2010-07-202010-07-202010-05-16http://hdl.handle.net/2097/4311Using pump-probe measurements, we characterize carrier decay time inside fused silica and measure deeply bound self-trapped excitons. With pump-probe delay, we also control free carrier injection and the subsequent avalanche process for laser machining applications.This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).Multiphoton processesUltrafast processesCondensed matterSemiconductorsText