Fukuzawa, HironobuTakanashi, TsukasaKukk, EdwinMotomura, KojiWada, Shin-ichiNagaya, KiyonobuIto, YutaNishiyama, ToshiyukiNicolas, ChristopheKumagai, YoshiakiIablonskyi, DenysMondal, SubhenduTachibana, TetsuyaYou, DaehyunYamada, SyuheiSakakibara, YutaAsa, KazukiSato, YuhiroSakai, TsukasaMatsunami, KenjiUmemoto, TakayukiKariyazono, KangoKajimoto, ShinjiSotome, HikaruJohnsson, PerSchöffler, Markus S.Kastirke, GregorKooser, KunoLiu, Xiao-JingAsavei, TheodorNeagu, LiviuMolodtsov, SergueiOchiai, KoheiKanno, ManabuYamazaki, KaoruOwada, ShigekiOgawa, KanadeKatayama, TetsuoTogashi, TadashiTono, KensukeYabashi, MakinaGhosh, AryyaGokhberg, KirillCederbaum, Lorenz S.Kuleff, Alexander I.Fukumura, HiroshiKishimoto, NaokiRudenko, ArtemMiron, CatalinKono, HirohikoUeda, Kiyoshi2020-06-172020-06-172019-05-16https://hdl.handle.net/2097/40680Understanding strong X-ray induced phenomena is important for applications of X-ray free-electron laser imaging. Here, the authors show time-resolved measurements of X-ray free-electron laser induced electronic decay of CH2I2 molecule probed with NIR pulses and identify mechanisms behind different transient states lifetimes.CC-BY-NC-ND 4.0 license https://creativecommons.org/licenses/by-nc-nd/4.0/Atomic and molecular interactions with photonsChemical physicsFree-electron lasersText