Tomlinson, Sean R.McGown, TySchlup, JohnAnthony, Jennifer L.2011-07-292011-07-292011-07-29http://hdl.handle.net/2097/10853X-ray diffraction is commonly used to examine zeolite structure, but it is unable to see small changes in the long-or short-range structure. Infrared spectroscopy is used to examine changes in the long-and short-range structure of zeolite. Structural changes in zeolite CIT-6 and derivatives upon chemical treatment are identified with mid-and far-infrared spectroscopy. Differences in the local structure of the sample are observed in the mid-and far-infrared spectra.ZeoliteInfrared spectroscopyX-ray diffractionAluminosilicateMid-infraredFar-infraredInfrared spectroscopy as a compliment to X-ray diffraction for zeolite examinationPoster