Rice, Reginald H.Gnecco, EnricoKing, William P.Szoszkiewicz, Robert2013-08-292013-08-292013-08-292013-08-15http://hdl.handle.net/2097/16381We report on spiral wear patterns produced at constant angular velocity by hot tip atomic force microscopy (HT-AFM) on surfaces of two common amorphous polymers: polystyrene (PS) and polymethylmethacrylate (PMMA). Topography of these patterns is obtained with regular AFM cantilevers. Topography cross-sections taken from a center of each spiral at a given azimuthal angle Θ relate changes of surface corrugation h[subscript corr] with tangential velocity v of a thermal cantilever. Polymer wear is characterized by a power law h[subscript corr](v) = α(v=v[subscript max])[superscript –β] , which yields a pre-factor α and an exponent β. Below the glass transition temperature T[subscript g], α is polymer specific and β varies weakly between similar conditions and samples. Variations of β are hypothesized to reflect polymer relaxation processes, which are expected to vary only weakly between amorphous polymers. At and above T[subscript g], α approaches initial thermal tip indentation depth within a polymer, β plummets, and a power law relation of h[subscript corr] with v diverges. These results are explained by heterogeneous wear around T[subscript g] due to a local nature of glass transition. At all studied temperatures, additional wear heterogeneities are found as due to position on the polymer and Θ. Variations of α and β with position on the polymer are found to be only marginally larger then uncertainties of the thermal tip-polymer interface temperature. Variations of α and β with Θ are found to be largely influenced by buckling of thermal cantilevers traveling in a spiral pattern.en-USThis Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).Spiral wear patternsNanostructuresPolymersAtomic force microscopy (AFM)WearArticle (author version)