| dc.citation.doi | 10.1016/j.cie.2014.05.020 | en_US |
| dc.citation.epage | 199 | en_US |
| dc.citation.jtitle | Computers & Industrial Engineering | en_US |
| dc.citation.spage | 187 | en_US |
| dc.citation.volume | 75 | en_US |
| dc.contributor.author | Chang, Shing I | |
| dc.contributor.author | Tavakkol, Behnam | |
| dc.contributor.author | Chou, Shih-Hsiung | |
| dc.contributor.author | Tsai, Tzong-Ru | |
| dc.contributor.authoreid | changs | en_US |
| dc.date.accessioned | 2014-10-16T20:05:28Z | |
| dc.date.available | 2014-10-16T20:05:28Z | |
| dc.date.issued | 2014-09-14 | |
| dc.date.published | 2014 | en_US |
| dc.description.abstract | A statistical process control (SPC) framework is proposed to detect potential changes of a wave profile on a real-time basis. In regular profile monitoring, change detection takes place when a complete profile is generated. In this study, the detection of a potential profile change takes place before the entire information on the profile of interest is fully available. The main research goal is to make a correct process decision as soon as possible. A real-world example of condensation-water-temperature profile monitoring was used to demonstrate the proposed framework. A simulation study was also conducted. The simulation results confirm that the proposed framework is capable of detecting profile changes without having to wait for the entire profile to be generated. | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/18376 | |
| dc.language.iso | en_US | en_US |
| dc.relation.uri | http://doi.org/10.1016/j.cie.2014.05.020 | en_US |
| dc.rights | This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s). | |
| dc.rights.uri | https://rightsstatements.org/page/InC/1.0/ | |
| dc.subject | Exponentially weighted moving average filter | en_US |
| dc.subject | Hotelling T² chart | en_US |
| dc.subject | Statistical process control | en_US |
| dc.subject | Profile analysis | en_US |
| dc.subject | Real-time monitoring | en_US |
| dc.title | Real-time detection of wave profile changes | en_US |
| dc.type | Text | en_US |
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