Techniques for precise energy calibration of particle pixel detectors

dc.citation.doi10.1063/1.4978281en_US
dc.citation.eissn1089-7623en_US
dc.citation.issn0034-6748en_US
dc.citation.issue033301en_US
dc.citation.jtitleReview of Scientific Instrumentsen_US
dc.citation.volume88en_US
dc.contributor.authorKroupa, M.
dc.contributor.authorCampbell-Ricketts, T.
dc.contributor.authorBahadori, Amir A.
dc.contributor.authorEmpl, A.
dc.contributor.authoreidbahadorien_US
dc.date.accessioned2017-03-17T21:31:23Z
dc.date.available2017-03-17T21:31:23Z
dc.date.issued2017-03-17
dc.date.published2017en_US
dc.descriptionCitation: M. Kroupa et al., Review of Scientific Instruments 88, 033301 (2017); doi: http://dx.doi.org/10.1063/1.4978281
dc.description.abstractWe demonstrate techniques to improve the accuracy of the energy calibration of Timepix pixel detectors, used for the measurement of energetic particles. The typical signal from such particles spreads among many pixels due to charge sharing effects. As a consequence, the deposited energy in each pixel cannot be reconstructed unless the detector is calibrated, limiting the usability of such signals for calibration. To avoid this shortcoming, we calibrate using low energy X-rays. However, charge sharing effects still occur, resulting in part of the energy being deposited in adjacent pixels and possibly lost. This systematic error in the calibration process results in an error of about 5% in the energy measurements of calibrated devices. We use FLUKA simulations to assess the magnitude of charge sharing effects, allowing a corrected energy calibration to be performed on several Timepix pixel detectors and resulting in substantial improvement in energy deposition measurements. Next, we address shortcomings in calibration associated with the huge range (from kiloelectron-volts to megaelectron-volts) of energy deposited per pixel which result in a nonlinear energy response over the full range. We introduce a new method to characterize the non-linear response of the Timepix detectors at high input energies. We demonstrate improvement using a broad range of particle types and energies, showing that the new method reduces the energy measurement errors, in some cases by more than 90%.en_US
dc.identifier.urihttp://hdl.handle.net/2097/35290
dc.language.isoen_USen_US
dc.relation.urihttp://dx.doi.org/10.1063/1.4978281en_US
dc.rightsPublished by AIP Publishing. This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).en_US
dc.rights.urihttp://www.sherpa.ac.uk/romeo/issn/0034-6748/
dc.subjectCalibrationen_US
dc.subjectRadiation detectorsen_US
dc.subjectProtonsen_US
dc.subjectSilicon detectorsen_US
dc.subjectPhotonsen_US
dc.titleTechniques for precise energy calibration of particle pixel detectorsen_US
dc.typeArticle (author version)en_US

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