Electron-ion interaction effects in attosecond time-resolved photoelectron spectra

dc.citation.doi10.1103/PhysRevA.82.043405en_US
dc.citation.epage043405-8en_US
dc.citation.issue4en_US
dc.citation.jtitlePhysical Review Aen_US
dc.citation.spage043405-1en_US
dc.citation.volume82en_US
dc.contributor.authorZhang, Chang-Hua
dc.contributor.authorThumm, Uwe P. E.
dc.contributor.authoreidthummen_US
dc.date.accessioned2013-05-31T21:35:34Z
dc.date.available2013-05-31T21:35:34Z
dc.date.issued2010-10-06
dc.date.published2010en_US
dc.description.abstractPhotoionization by attosecond extreme ultraviolet (xuv) pulses into the laser-dressed continuum of the ionized atom is commonly described in strong-field approximation, neglecting the Coulomb interaction between the emitted photoelectron (PE) and the residual ion. By solving the time-dependent Schrödinger equation, we identify a temporal shift δτ in streaked PE spectra, which becomes significant at low PE energies. Within an eikonal approximation, we trace this shift to the combined action of Coulomb and laser forces on the released PE, suggesting the experimental and theoretical scrutiny of their coupling in streaked PE spectra. Further, we examined the effect of initial state polarization by the laser pulse on the xuv streaked spectrum.en_US
dc.identifier.urihttp://hdl.handle.net/2097/15871
dc.language.isoen_USen_US
dc.relation.urihttps://doi.org/10.1103/PhysRevA.82.043405en_US
dc.rightsThis Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).en_US
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectElectron-ion interaction effectsen_US
dc.subjectCoulomb interactionen_US
dc.subjectExtreme-ultraviolet (XUV) radiationen_US
dc.subjectPhotoionizationen_US
dc.titleElectron-ion interaction effects in attosecond time-resolved photoelectron spectraen_US
dc.typeArticle (publisher version)en_US

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