Development of an electron time of flight spectrometer for ultrafast pulse characterization and ultrafast dynamics studies

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dc.contributor.author Timilsina, Pratap
dc.date.accessioned 2016-04-22T13:56:19Z
dc.date.available 2016-04-22T13:56:19Z
dc.date.issued 2016-05-01 en_US
dc.identifier.uri http://hdl.handle.net/2097/32598
dc.description.abstract This report presents the details of an electron time-of-flight (ETOF) spectrometer to be used for characterizing ultrafast electric field pulses. The pulses will range in pulse-duration from femtosecond to attoseconds and in wavelength from the far infrared (FIR) to the extreme ultra violet (XUV). By measuring the photoelectrons in the presence of two electric fields and their quantum interference we will be able to extract the amplitude and phase of the electric field. For XUV pulses this is the well-known streaking and Reconstruction of Attosecond Beating by Interference of Two-Photon Transition (RABITT) method. The ETOF is based on a set of tunable electrostatic lenses capable of detecting 0-150 eV electrons. In addition, we can selectively increase the photoelectron yield of the spectrum. The precise tuning of the electrostatic lens system is done with a Genetic Algorithm (GA) with an intensity fluctuation discriminator in the fitness. en_US
dc.language.iso en_US en_US
dc.publisher Kansas State University en
dc.subject Electron time of flight en_US
dc.subject Ultrafast en_US
dc.subject Spectrometer en_US
dc.title Development of an electron time of flight spectrometer for ultrafast pulse characterization and ultrafast dynamics studies en_US
dc.type Report en_US
dc.description.degree Master of Science en_US
dc.description.level Masters en_US
dc.description.department Department of Physics en_US
dc.description.advisor Carlos Trallero en_US
dc.date.published 2016 en_US
dc.date.graduationmonth May en_US


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