Browsing College of Engineering by Subject "X-ray diffraction"

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Browsing College of Engineering by Subject "X-ray diffraction"

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  • Whiteley, C. E.; Kirkham, M. J.; Edgar, James H. (2013-04-10)
    The present investigation was undertaken to determine the coefficients of thermal expansion for the boron-rich compound semiconductor icosahedral boron arsenide (B[subscript 12]As[subscript 2]). B[subscript 12]As[subscript ...
  • Xu, Z.; Edgar, James H.; Speakman, S. (2013-11-08)
    The morphology and crystal structure of rhombohedral B[subscript 12]As[subscript 2] thin films prepared by chemical vapor deposition on Si (100), Si (110) and Si (111) substrates were examined. For short depositions, 30 ...
  • Edgar, James H.; Bohnen, T.; Hageman, P. R. (2010-06-10)
    The epitaxy of scandium nitride deposited by hydride vapor phase epitaxy on 6HSiC( 0001) substrates is reported. The structure and composition of the deposited films were dependent on both the scandium metal source and ...
  • Zhang, Yu; Chen, Hui; Dudley, Michael; Zhang, Yi; Edgar, James H.; Gong, Yinyan; Bakalova, Silvia; Kuball, Martin; Zhang, Lihua; Su, Dong; Kisslinger, Kim; Zhu, Yimei (Materials Research Society, 2010-07-29)
    Epitaxial growth of icosahedral boron arsenide (B[subscript]12As[subscript]2, abbreviated here as IBA) on 4HSiC substrates intentionally misoriented from (0001) towards [1-100] is shown to eliminate rotational twinning. ...

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