Single-kernel near-infrared analysis for evaluating wheat samples for Fusarium head blight resistance

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dc.contributor.author Peiris, Kamaranga
dc.contributor.author Dong, Yanhong
dc.contributor.author Bockus, William W.
dc.contributor.author Dowell, Floyd E.
dc.date.accessioned 2014-03-24T20:15:24Z
dc.date.available 2014-03-24T20:15:24Z
dc.date.issued 2014-03-24
dc.identifier.uri http://hdl.handle.net/2097/17254
dc.description.abstract This report describes a method to estimate the bulk deoxynivalenol (DON) content of wheat grain samples with the single-kernel DON levels estimated by a single-kernel near-infrared (SKNIR) system combined with single-kernel weights. The described method estimated the bulk DON levels in 90% of 160 grain samples to within 6.7 ppm of DON when compared with the DON content determined with the gas chromatography–mass spectrometry method. The single-kernel DON analysis showed that the DON content among DON-containing kernels (DCKs) varied considerably. The analysis of the distribution of DON levels among all kernels and among the DCKs of grain samples is helpful for the in-depth evaluation of the effect of varieties or fungicides on Fusarium head blight (FHB) reactions. The SKNIR DON analysis and estimation of the single-kernel DON distribution patterns demonstrated in this study may be helpful for wheat breeders to evaluate the FHB resistance of varieties in relation to their resistance to the spread of the disease and resistance to DON accumulation. en_US
dc.language.iso en_US en_US
dc.relation.uri http://cerealchemistry.aaccnet.org/doi/abs/10.1094/CCHEM-11-12-0157-R en_US
dc.subject Deoxynivalenol en_US
dc.subject Wheat en_US
dc.subject Fusarium head blight en_US
dc.title Single-kernel near-infrared analysis for evaluating wheat samples for Fusarium head blight resistance en_US
dc.type Article (publisher version) en_US
dc.date.published 2014 en_US
dc.citation.doi doi:10.1094/CCHEM-11-12-0157-R en_US
dc.citation.epage 40 en_US
dc.citation.issue 1 en_US
dc.citation.jtitle Cereal Chemistry en_US
dc.citation.spage 35 en_US
dc.citation.volume 91 en_US
dc.contributor.authoreid khsp en_US
dc.contributor.authoreid bockus en_US
dc.contributor.authoreid fdowell en_US


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