Prediction of mean time between failures of electronic subsystems from component failure rates determined under varying environmental conditions
| dc.contributor.author | Hetland, Joel S. | en_US |
| dc.date.accessioned | 2015-12-31T15:32:18Z | |
| dc.date.available | 2015-12-31T15:32:18Z | |
| dc.date.issued | 1965 | en_US |
| dc.date.published | 1965 | en_US |
| dc.description | Call number: LD2668 .R4 1965 H589 | en_US |
| dc.description.level | Masters | en_US |
| dc.identifier.uri | http://hdl.handle.net/2097/23509 | |
| dc.subject.AAT | Masters theses | en_US |
| dc.title | Prediction of mean time between failures of electronic subsystems from component failure rates determined under varying environmental conditions | en_US |
| dc.type | Text | en_US |
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