Surface science experiments involving the atomic force microscope

dc.contributor.authorMcBride, Sean P.
dc.date.accessioned2012-02-13T15:31:09Z
dc.date.available2012-02-13T15:31:09Z
dc.date.graduationmonthMayen_US
dc.date.issued2012-02-13
dc.date.published2012en_US
dc.description.abstractThree diverse first author surfaces science experiments conducted by Sean P. McBride 1-3 will be discussed in detail and supplemented by secondary co-author projects by Sean P. McBride, 4-7 all of which rely heavily on the use of an atomic force microscope (AFM). First, the slip length parameter, b of liquids is investigated using colloidal probe AFM. The slip length describes how easily a fluid flows over an interface. The slip length, with its exact origin unknown and dependencies not overwhelming decided upon by the scientific community, remains a controversial topic. Colloidal probe AFM uses a spherical probe attached to a standard AFM imaging tip driven through a liquid. With the force on this colloidal AFM probe known, and using the simplest homologous series of test liquids, many of the suspected causes and dependencies of the slip length demonstrated in the literature can be suppressed or eliminated. This leaves the measurable trends in the slip length attributed only to the systematically varying physical properties of the different liquids. When conducting these experiments, it was realized that the spring constant, k, of the system depends upon the cantilever geometry of the experiment and therefore should be measured in-situ. This means that the k calibration needs to be performed in the same viscous liquid in which the slip experiments are performed. Current in-situ calibrations in viscous fluids are very limited, thus a new in-situ k calibration method was developed for use in viscous fluids. This new method is based upon the residuals, namely, the difference between experimental force-distance data and Vinogradova slip theory. Next, the AFM’s ability to acquire accurate sub nanometer height profiles of structures on interfaces was used to develop a novel experimental technique to measure the line tension parameter, τ, of isolated nanoparticles at the three phase interface in a solid-liquid-vapor system. The τ parameter is a result of excess energy caused by the imbalance of the complex intermolecular forces experienced at the three phase contact line. Many differences in the sign and magnitude of the τ parameter exist in the current literature, resulting in τ being a controversial topic.en_US
dc.description.advisorBruce M. Lawen_US
dc.description.degreeDoctor of Philosophyen_US
dc.description.departmentDepartment of Physicsen_US
dc.description.levelDoctoralen_US
dc.description.sponsorshipThis research was funded by the National Science Foundation grants DMR-0603144 and CTS-0609318.en_US
dc.identifier.urihttp://hdl.handle.net/2097/13459
dc.language.isoen_USen_US
dc.publisherKansas State Universityen
dc.subjectLine tensionen_US
dc.subjectSurface scienceen_US
dc.subjectSlip lengthen_US
dc.subjectAtomic force microscope (AFM)en_US
dc.subjectColloidal probe AFMen_US
dc.subjectResiduals calibrationen_US
dc.subject.umiCondensed Matter Physics (0611)en_US
dc.subject.umiNanoscience (0565)en_US
dc.subject.umiPhysics (0605)en_US
dc.titleSurface science experiments involving the atomic force microscopeen_US
dc.typeDissertationen_US

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