Estimating grain yield using spectral reflectance data in winter wheat genotypes

dc.contributor.authorShields, Phil.en_US
dc.date.accessioned2015-12-30T23:11:21Z
dc.date.available2015-12-30T23:11:21Z
dc.date.issued1987en_US
dc.date.published1987en_US
dc.descriptionCall number: LD2668 .T4 AGRN 1987 S54en_US
dc.description.degreeMaster of Scienceen_US
dc.description.departmentAgronomyen_US
dc.description.levelMastersen_US
dc.identifier.urihttp://hdl.handle.net/2097/22227
dc.subject.AATMasters thesesen_US
dc.titleEstimating grain yield using spectral reflectance data in winter wheat genotypesen_US
dc.typeTexten_US

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