Off-line quality control by robust parameter design

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dc.contributor.author Min, Jun Young
dc.date.accessioned 2008-04-08T19:06:55Z
dc.date.available 2008-04-08T19:06:55Z
dc.date.issued 2008-04-08T19:06:55Z
dc.date.submitted May 2008 en
dc.identifier.uri http://hdl.handle.net/2097/597
dc.description.abstract There have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's robust parameter design, response surface approach and semi-parameter design. Considerable attention has been placed on the semi-parameter design. This approach is new technology that was introduced to Picke, Robinson, Birch and Anderson-Cook (2006). The method is a combined parametric and nonparametric technique to improve the estimates of both the mean and the variance of the response. en
dc.language.iso en_US en
dc.publisher Kansas State University en
dc.subject Robust en
dc.subject Taguchi en
dc.subject response en
dc.subject semi-parameter en
dc.title Off-line quality control by robust parameter design en
dc.type Report en
dc.description.degree Master of Science en
dc.description.level Masters en
dc.description.department Department of Statistics en
dc.description.advisor Shie-Shien Yang en
dc.subject.umi Statistics (0463) en
dc.date.published 2008 en
dc.date.graduationmonth May en

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