From carrier dynamics inside fused silica to control of multiphoton-avalanche ionization for laser machining

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From carrier dynamics inside fused silica to control of multiphoton-avalanche ionization for laser machining

Lei, S.; Grojo, D.; Barillot, T.; Gertsvolf, M.; Chang, Z.; Rayner, D. M.; Corkum, P. B.
Conference paper
Publication Date: 2010
Conference: 2010 Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), San Jose, California, May 16-21, 2010
Starting Page: 1, Ending Page: 2
Publisher: Institute of Electrical and Electronics Engineers

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Abstract:

Using pump-probe measurements, we characterize carrier decay time inside fused silica and measure deeply bound self-trapped excitons. With pump-probe delay, we also control free carrier injection and the subsequent avalanche process for laser machining applications.

Keywords: Multiphoton processes; Ultrafast processes; Condensed matter; Semiconductors

URL for this item: http://hdl.handle.net/2097/4311
Publisher URL: http://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=5501040
Permissions: Copyright 2010 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

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