Lei, Shuting; Grojo, D.; Barillot, T.; Gertsvolf, M.; Chang, Z.; Rayner, D. M.; Corkum, P. B.
(Institute of Electrical and Electronics Engineers, 2010)
Using pump-probe measurements, we characterize carrier decay time inside fused silica and measure deeply bound self-trapped excitons. With pump-probe delay, we also control free carrier injection and the subsequent avalanche ...