| dc.contributor.author |
Tomlinson, Sean |
|
| dc.contributor.author |
McGown, Ty |
|
| dc.contributor.author |
Schlup, John |
|
| dc.contributor.author |
Anthony, Jennifer |
|
| dc.date.accessioned |
2011-07-29T13:54:18Z |
|
| dc.date.available |
2011-07-29T13:54:18Z |
|
| dc.date.issued |
2011-07-29 |
|
| dc.identifier.uri |
http://hdl.handle.net/2097/10853 |
|
| dc.description.abstract |
X-ray diffraction is commonly used to examine zeolite structure, but it is unable to see small changes in the long-or short-range structure. Infrared spectroscopy is used to examine changes in the long-and short-range structure of zeolite.
Structural changes in zeolite CIT-6 and derivatives upon chemical treatment are identified with mid-and far-infrared spectroscopy. Differences in the local structure of the sample are observed in the mid-and far-infrared spectra. |
en_US |
| dc.relation.ispartof |
K-State Research Forum |
en_US |
| dc.subject |
Zeolite |
en_US |
| dc.subject |
Infrared spectroscopy |
en_US |
| dc.subject |
X-ray diffraction |
en_US |
| dc.subject |
Aluminosilicate |
en_US |
| dc.subject |
Mid-infrared |
en_US |
| dc.subject |
Far-infrared |
en_US |
| dc.title |
Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination |
en_US |
| dc.type |
Poster |
en_US |
| dc.date.published |
2011 |
en_US |
| dc.description.conference |
16th Annual K-State Research Forum, Kansas State University, Manhattan, KS, April 20, 2011 |
en_US |
| dc.contributor.authoreid |
srt5555 |
en_US |
| dc.contributor.authoreid |
jrsch |
en_US |
| dc.contributor.authoreid |
anthonyj |
en_US |