Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination

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dc.contributor.author Tomlinson, Sean
dc.contributor.author McGown, Ty
dc.contributor.author Schlup, John
dc.contributor.author Anthony, Jennifer L.
dc.date.accessioned 2011-07-29T13:54:18Z
dc.date.available 2011-07-29T13:54:18Z
dc.date.issued 2011-07-29
dc.identifier.uri http://hdl.handle.net/2097/10853
dc.description.abstract X-ray diffraction is commonly used to examine zeolite structure, but it is unable to see small changes in the long-or short-range structure. Infrared spectroscopy is used to examine changes in the long-and short-range structure of zeolite. Structural changes in zeolite CIT-6 and derivatives upon chemical treatment are identified with mid-and far-infrared spectroscopy. Differences in the local structure of the sample are observed in the mid-and far-infrared spectra. en_US
dc.relation.isPartOf K-State Research Forum en_US
dc.subject Zeolite en_US
dc.subject Infrared spectroscopy en_US
dc.subject X-ray diffraction en_US
dc.subject Aluminosilicate en_US
dc.subject Mid-infrared en_US
dc.subject Far-infrared en_US
dc.title Infrared spectroscopy as a compliment to X-ray diffraction for zeolite examination en_US
dc.type Poster en_US
dc.date.published 2011 en_US
dc.description.conference 16th Annual K-State Research Forum, Kansas State University, Manhattan, KS, April 20, 2011 en_US
dc.contributor.authoreid srt5555 en_US
dc.contributor.authoreid jrsch en_US
dc.contributor.authoreid anthonyj en_US

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